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Isolation Testing B-Type Leakage Sensor
  • Isolation Testing B-Type Leakage SensorIsolation Testing B-Type Leakage Sensor
  • Isolation Testing B-Type Leakage SensorIsolation Testing B-Type Leakage Sensor
  • Isolation Testing B-Type Leakage SensorIsolation Testing B-Type Leakage Sensor

Isolation Testing B-Type Leakage Sensor

An important safety function of these devices is monitor of the leakage current of the entire system from Power modules against earth. A defective system can become dangerous for people or cause fires. Before it comes so far, Power modules must be disconnect from the grid. The leakage current contains DC and AC components. Therefore an AC/DC-sensitive monitoring unit is necessary.

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Product Description

Features

■ Single Supply +5 V

■ High and low level output

■ Self-test function

■ Mounted on PCB board


Applications

■ Ground fault detection

■ Electric vehicle charge station

■ Converter leakage current detection


Standard

■ Applicable for IEC 62752 residual current requirements

■ Applicable for IEC 62955 residual current requirements for RDC-MD

■ Components designed full-fill RoHS/REACH


Overview

An important safety function of these devices is monitor of the leakage current of the entire system from Power modules against earth. A defective system can become dangerous for people or cause fires. Before it comes so far, Power modules must be disconnect from the grid. The leakage current contains DC and AC components. Therefore an AC/DC-sensitive monitoring unit is necessary.


The XKCA Series Residual Current Detection Module is widely applicable, especially in public charging stations for electric vehicles, electric motorcycles, electric bicycles, charging fees, and power safety management. It offers simple usage and easy installation.


Typical Application Schematic:

Pin Definition:

Pin Number Symbol Pin Type Functions
1 VDD Power Module power supply, standard voltage 5VDC
Voltage input required to be within 4.85~5.15VDC, power output capability > 100mA
Power supply ripple ≤ 150mV
2 TRIP OUTPUT When the residual current exceeds the threshold, the output level changes from bottom to high
3 GND Power Ground
4 CAL INPUT When this pin been conducted to 0VDC, module will calculate the zero-point-drift and store the value to register in the MCU to finish the calibration operation.
When using the CAL function, the main circuit must be cut-off to ensure no residual current flow
5 TEST INPUT Before starting charging, perform a simulation test on the product through this pin to verify whether the product functions normally


Electrical/Reliability Characteristics:

Char Min Typ Max Unit
1 Primary nominal RMS current (1phase / 3phase) 32 80 A
2 Supply voltage 4.85 5 5.15 V
3 Relative Humidity 95 %
4 Ambient operation temperature -40 +105
5 Ambient storage temperature -20 +65
6 Power Consumption ≤110 mW
7 Voltage input/output, low level 0 0.6 V
8 Voltage input/output, high level 4.2 5 V
9 Theoretical design life ≧20 Yr
10 Operating altitude ≤4000 m


Trip-Current (residual current related characteristics):

Wav Freq Min Typ Max Unit
1 S-DC - 3 4.5 6 mA
2 2PDC - 3.5 5 7 mA
3 3PDC - 3.1 4.5 6.2 mA


Trip-Time (residual current related characteristics):

Wav Freq Current Typ Max Unit
1 S-DC - 6mA 100 1000 ms
2 S-DC - 60mA 50 300 ms
3 S-DC - 200mA 50 100 ms
4 2PDC - 60mA 50 300 ms
5 2PDC - 200mA 50 100 ms
6 3PDC - 60mA 50 300 ms
7 3PDC - 200mA 50 100 ms


NoTrip-Time (residual current related characteristics):

Wav Freq Current Low-limit Unit
1 AC 50Hz 30mA ms
2 AC 50Hz 60mA 300 ms
3 AC 50Hz 150mA 80 ms
4 AC 50Hz 5A 80 ms


Product Dimension (mm):

Note: Terminal wires can be customized.


Timing Diagram:

■ VDD power-up speed ≤ 5ms/V

■ T1 as the waiting time, it is suggested T1 ≥ 100ms

■ 50ms≤ T2≤100ms, cal pin low time greater than 50ms, the product begins to enter the zero phase

■ T3≥500ms and wait for the zero to complete

■ T4≈400ms, and the Test self-test signal enable must wait until T3 is complete before it can be applied

■ TRIP pin output high duration Tx = 100mS (verify self-test function)

■ Ty=100ms is the TRIP pin high level fading time (disables self-test verification)


Self-Test Circuit:

■ 2 widing on the ZCT to generate simualted DC residual current
■ By using VDD to generate typical value = 6.53 mADC simulated residual current
■ This current is the most restricted tripping condition to test whether system is working correct


Digital Signal Flip Threshold:

■ For avoiding the signal oscillation, tripping signal output flipping has been set with tripping threshold and recovery threshold

■ When tripping threshold  reached,the related X-OUT flip,and when the current decrease to the recovery threshold  , the related X-OUT flip again, back to low level state

is set as 100% typical tripping value, and  is set as 55% typical tripping value





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